Shift Left Complicates Fab Data Management
Semiconductor fabs are using real-time equipment sensor data and AI/ML inference models to move yield anomaly detection inside process modules, accelerating yield learning and improving advanced process control (APC). Equipment sensor sampling has risen from about once per second to once every few tens of milliseconds, data types have grown at least 10x compared with a decade ago, and some fabs generate hundreds of petabytes per year. How to process data in sub-second timescales while preserving context and connectivity is the main data management challenge shift left brings.