Teradyne Titan HP 平台：面向 AI 与数据中心的系统级测试观察
Perspectives On Test: System Level Test For AI & Data Centers
Teradyne 整合系统测试部门高级总监 Ben Mitchel 谈系统级测试为何在 AI 与数据中心设备量产中变得至关重要。这些设备采用多 chiplet 设计、功耗达数千瓦，需在真实条件下测试。Titan HP 平台可提供此类设备所需的功率、热管理与吞吐能力。
Testing every device under real-world conditions has never been more important.
As AI and data center devices grow in complexity, with multi-chiplet designs and power envelopes in the thousands of watts, testing every device under real-world conditions has never been more important.
Ben Mitchel, senior director of product management and business development for integrated systems test, discusses why system-level test is now mission-critical in high-volume manufacturing and how Teradyne’s Titan HP platform delivers the power, thermal management, and throughput that AI and cloud infrastructure devices require.
Ben Mitchel
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Ben Mitchel is senior director of product marketing and business development at teradyne, where he leads market strategy and business growth for the company’s test solutions. With 30 years of experience across engineering, product line management, sales and general management, Mitchel has held senior roles at Teradyne, Asterion, SatCon Power Systems and Sycamore Networks. He holds a Bachelor of Science in Electrical Engineering from Worcester Polytechnic Institute and an MBA from the Isenberg School of Management at the University of Massachusetts Amherst.
来源：Semiconductor Engineering 芯片与封装 · semiengineering.com