Perspectives On Test: System Level Test For AI & Data Centers

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Ben Mitchel, senior director of Teradyne's Integrated System Test division, explains why system-level test has become critical for mass production of AI and data center equipment. These devices use multi-chiplet designs and draw thousands of watts, requiring testing under real-world conditions. The Titan HP platform delivers the power, thermal management, and throughput such devices demand.

Article · English

Testing every device under real-world conditions has never been more important.

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As AI and data center devices grow in complexity, with multi-chiplet designs and power envelopes in the thousands of watts, testing every device under real-world conditions has never been more important.

Ben Mitchel, senior director of product management and business development for integrated systems test, discusses why system-level test is now mission-critical in high-volume manufacturing and how Teradyne’s Titan HP platform delivers the power, thermal management, and throughput that AI and cloud infrastructure devices require.

Ben Mitchel

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Ben Mitchel is senior director of product marketing and business development at teradyne, where he leads market strategy and business growth for the company’s test solutions. With 30 years of experience across engineering, product line management, sales and general management, Mitchel has held senior roles at Teradyne, Asterion, SatCon Power Systems and Sycamore Networks. He holds a Bachelor of Science in Electrical Engineering from Worcester Polytechnic Institute and an MBA from the Isenberg School of Management at the University of Massachusetts Amherst.