Siemens Tessent IST Combines Voltage Monitoring to Distinguish False Test Failures
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Siemens continues to expand its offerings in chip test and monitoring. Previously, Siemens demonstrated a approach combining Tessent In-System Test (IST) with voltage monitoring: using the Movellus Aeonic Insight voltage-drop sensor together with Tessent Embedded Analytics, voltage-aware observability helps distinguish false failures in testing. On October 29, 2026, Semiconductor Engineering reported that Siemens demonstrated this combined solution on the Veloce proFPGA platform, adding Tessent IST to its monitoring demo that combines the Movellus Aeonic Insight voltage-drop sensor with Tessent Embedded Analytics, extending the capability from functional monitoring to in-system test and showcasing the expanded application of voltage-aware observability. The demo is currently presented on the above platforms; no further reports of production deployment have been seen.
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- Semiconductor Engineering Chips and PackagingFrom Functional Monitoring To In-System Test: Extending Voltage-Aware Observability
Siemens added Tessent In-System Test (IST) to its monitoring demo, which combines Movellus Aeonic Insight voltage droop sensors with Tessent Embedded Analytics, showcased on the Veloce proFPGA platform.
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