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CPO Testing Faces Target Drift Challenges
1 reports 1 reporting sources 10 days ago updated
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On October 8, 2026, Semiconductor Engineering released a roundtable discussion focused on the challenges of CPO/NPO testing, featuring experts from Teradyne, Advantest, ISE Labs, and Keysight. The experts noted that CPO testing faces a dynamic challenge: connectors and laser sources have not yet been finalized, meaning the test targets themselves are shifting. The report only discloses the holding of the roundtable and the topics above, without further specific details.
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- Semiconductor Engineering Chips and PackagingCPO Testing Faces A Moving Target Problem
Semiconductor Engineering gathered experts from Teradyne, Advantest, ISE Labs and Keysight to discuss CPO/NPO test challenges.